Northrop Grumman Advances Radiation-Resistant Microelectronics Testing with DARPA Program

Northrop Grumman has demonstrated a secure testing environment for microelectronics used in radiation-prone areas, such as space and nuclear facilities, under DARPA's ASSERT program. The innovation aims to reduce testing time from years to months, allowing for faster deployment of radiation-hardened microelectronics. Northrop Grumman's technology simulates randomized radiation conditions and can test space-bound and nuclear microelectronics in a compact and portable laboratory environment. This solution has the potential to drastically reduce lead times on critical microelectronics, ensuring customers receive the systems they need faster than ever.