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Aehr Test Systems to Showcase Semiconductor Solutions at 14th Annual NYC Summit
ByAinvest
Wednesday, Dec 3, 2025 7:39 am ET1min read
Aehr Test Systems will participate in the 14th Annual NYC Summit investor conference on December 16th. President and CEO Gayn Erickson will discuss the company's expanding role in enabling next-gen semiconductor devices across various markets, including wafer-level burn-in and package-level burn-in solutions. The presentation material will be available on Aehr Test's investor relations website.
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