Aehr Test to Participate in Needham Virtual Semiconductor Conference on August 20
ByAinvest
Monday, Aug 18, 2025 7:53 am ET1min read
AEHR--
Aehr Test Systems specializes in wafer level test and packaged part burn-in solutions for semiconductor production. The company's solutions cater to a diverse range of markets, including electric vehicles, data centers, and 5G infrastructure. Notably, Aehr Test's recent acquisition of Incal Technology has expanded its capabilities to include high-power packaged part reliability/burn-in test solutions for the rapidly growing artificial intelligence (AI) semiconductor market.
The company's offerings include silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for power conversion applications, and silicon photonics devices for data centers and 5G infrastructure. Additionally, Aehr Test provides solutions for AI processors in both wafer level and packaged part forms. The growing adoption of wafer level test and packaged part burn-in for these devices is a key growth driver for Aehr Test.
For additional information or to schedule a meeting with Aehr management, interested parties can contact their Needham representative or Aehr's investor relations firm, PondelWilkinson, Inc., at jbyers@pondel.com.
References:
[1] https://www.morningstar.com/news/accesswire/1061714msn/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-20
[2] https://finance.yahoo.com/news/aehr-test-systems-participate-needham-113000794.html
[3] https://www.stocktitan.net/news/AEHR/aehr-test-systems-to-participate-in-the-needham-virtual-tax5yd5zk8t4.html
Aehr Test Systems will participate in the Needham Virtual Semiconductor and SemiCap 1x1 Conference on August 20. The company will host virtual meetings with investors to discuss its wafer level test and packaged part burn-in solutions, including its high power packaged part reliability/burn-in test solutions for the AI semiconductor market. Aehr Test provides turn-key solutions for improving quality, reliability, and yield of semiconductors in various markets, including electric vehicles, data centers, and 5G infrastructure.
FREMONT, CA / ACCESS Newswire / August 18, 2025 / Aehr Test Systems (NASDAQ:AEHR), a leading provider of semiconductor test and burn-in equipment, has announced its participation in the 6th Annual Needham Virtual Semiconductor and SemiCap 1x1 Conference on Wednesday, August 20, 2025. The company's President and CEO Gayn Erickson and CFO Chris Siu will host virtual meetings with investors throughout the day to discuss the company's innovative solutions.Aehr Test Systems specializes in wafer level test and packaged part burn-in solutions for semiconductor production. The company's solutions cater to a diverse range of markets, including electric vehicles, data centers, and 5G infrastructure. Notably, Aehr Test's recent acquisition of Incal Technology has expanded its capabilities to include high-power packaged part reliability/burn-in test solutions for the rapidly growing artificial intelligence (AI) semiconductor market.
The company's offerings include silicon carbide devices used in electric vehicles and charging infrastructure, gallium nitride devices for power conversion applications, and silicon photonics devices for data centers and 5G infrastructure. Additionally, Aehr Test provides solutions for AI processors in both wafer level and packaged part forms. The growing adoption of wafer level test and packaged part burn-in for these devices is a key growth driver for Aehr Test.
For additional information or to schedule a meeting with Aehr management, interested parties can contact their Needham representative or Aehr's investor relations firm, PondelWilkinson, Inc., at jbyers@pondel.com.
References:
[1] https://www.morningstar.com/news/accesswire/1061714msn/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-20
[2] https://finance.yahoo.com/news/aehr-test-systems-participate-needham-113000794.html
[3] https://www.stocktitan.net/news/AEHR/aehr-test-systems-to-participate-in-the-needham-virtual-tax5yd5zk8t4.html

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